SencorpWhite Expands RFID Expertise

SencorpWhite, the leader in the design and manufacture of Automated Storage and Retrieval Systems (AS/RS), has added Maurizio Turri as Executive Account Manager for Auto-ID Integration.

Mr. Turri will further SencorpWhite's advancement integrating automatic part identification inventory management technologies (Auto-ID) with their industry leading AS/RS systems and software, through his extensive application expertise and customer support.

By adding Auto-ID expertise and expanding its partnerships with leading research centers, SencorpWhite is exploring the use of RFID technology to optimize the supply and real-time inventory management of a variety of high-value products likes those typically associated with the delivery of healthcare at hospitals, clinics, and physicians' offices. SencorpWhite's leading-edge AS/RS carousel systems leverage advanced software to deliver customers greater inventory management control, efficiency, and supply chain savings.

“We are very excited to have Maurizio join the team, especially given his strong technical experience with applying Auto-ID research to real-world applications,” stated Brian Urban, President and CEO of SencorpWhite. “Integration of Auto-ID technologies plays a critical role within SencorpWhite's Distributed Inventory model, a concept that supports secure inventory control at the point of use or sale, mitigating the need for inefficient storage systems, like central stockrooms. We see many potential benefits for our customers with this intelligent departure from a traditional supply chain—especially in industries dealing with high-value inventory, such as healthcare and aerospace.”

Prior to joining SencorpWhite, Mr. Turri was Lab Manager for the University of Arkansas's RFID Research Center, responsible for managing pilot research and development programs using RFID technology. Mr. Turri has a Bachelor of Science in Business Administration from the University of Arkansas at Fayetteville and is a published author who has contributed to the RFID Journal.
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